Conceptual figure of directional scattering (reflection).
An example of 3D visualization for the scattering distribution.
Conceptual figure of directional scattering (reflection) with polarization.
In ordinary optical simulations, reflections and transmissions that take place on a surface of objects are simplified to have no angular dependency. This software provides a possibility to handle directional scattering as an advanced scattering model. It allows modeling reflections and transmissions on material surfaces with higher fidelity.
Applications
The following surfaces can be defined:
- Surface with the directional diffuse reflection (e.g. printing inks)
- Surface with the intermediate scattering property between perfect specular reflection and perfect diffusion (e.g. reflection films)
- Surface with microstructure formed using fine processing technology (e.g. diffusion films)
- Surfaces covered by coating materials containing reflective flakes (e.g. metallic and pearlescent coatings)
- Surface with directional polarization characteristics (e.g. DBEF)
Features
- Import of the scattering distribution (BSDF) measured by a spectral goniophotometer
- Spectral angular dependency of reflectance and transmittance
- Angular dependency represented in arbitrary angular dependency ranging from one- to four-dimensional
- 3D visualization of the scattering distribution for verification
- Generation of scattering distribution from surface profile data measured by a 3D surface profiler
- Possibility to define polarization with angular dependency
- Measurement service available to obtain scattering distribution of samples
Specification
| Subject of angular dependency description |
- Diffuse reflectance (BRDF)
- Diffuse transmittance (BTDF)
- Specular reflectance (BRDF)
- Specular transmittance (BTDF)
- Muller matrix (for BRDF/BTDF with polarization)
|
Color representation |
- Spectral (visible light: 390-730nm, 10nm step)
- CIE XYZ
- RGB
- Monochrome
|
Angle range |
- Incidence: 0-180 degrees elevation, 0-360 degrees azimuth
- Emission: 0-180 degrees elevation, 0-360 degrees azimuth*1
|
Resolution |
- Arbitrary angular dependency ranging from one- to four-dimensional
- Arbitrary interval for the angle of incidence and emission
|
Others |
- Text file interface
- Generation of the scattering distribution from surface profile data
- Measurement service available
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